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Postdoctoral research
Name:Hua-Chang Wan
Publication (In press)
- Hua-Chiang Wen, Chia-I Hung, Hsin-Jung Tsai, Chieh-Kien Lu, Yao-Cheng Lai, Wen-Kuang Hsu, ZnO-coated carbon nanotubes: An enhanced and red-shifted emission band at UV-VIS wavelength, Journal of Materials Chemistry, 2012 (SCI IF=5.968)
- Ming-Jhang Wu, Hua-Chiang Wen*, Tun-Yuan Chiang, Chien-Huang Tsai, Wen-Kuang Hsu, Chang-Pin Chou, Thermal reliability of thin SiGe epilayers, Applied Surface Science, 2012, 258, 5001–5004 (SCI IF=2.032)
Publication
- Ming-Jhang Wu, Hua-Chiang Wen*, Shyh-Chi Wu, Ping-Feng Yang, Yi-Shao Lai, Wen-Kuang Hsu, Wen-Fa Wu, Chang-Pin Chou, Evaluating nanotribological behavior of annealing Si0.8Ge0.2/Si films, Microelectronics Reliability, 2011, 51, 2223-2227 (SCI IF=1.117)
- Ming-Jhang Wu, Hua-Chiang Wen*, Shyh-Chi Wu, Ping-Feng Yang, Yi-Shao Lai, Wen-Kuang Hsu, Wen-Fa Wu, Chang-Pin Chou, Nanomechanical characteristics of annealed Si/SiGe superlattices, Applied Surface Science, 2011, 257, Pages 8887-8893 (SCI IF=2.032)
- Tien-Yu Lin, Hua-Chiang Wen*, Zue-Chin Chang, Wen-Kuang Hsu, Chang-Pin Chou, Chien-Huang Tsai, Derming Lian, Nanoscratch studies of SiGe epitaxial layer damage on the Si substrate, Journal of Physics and Chemistry of Solids, 2011, 72, Pages 789-793 (SCI IF=1.632)
- Wei-Hung Yau, Pai-Chung Tseng, Hua-Chiang Wen*, Chien-Huang Tsai, Wu-Ching Chou, Luminescence properties of mechanically nanoindented ZnSe, Microelectronics Reliability, 2011, 51, Pages 931-935 (SCI IF=1.117)
- Meng-Hung Lin, Hua-Chiang Wen*, Yeau-Ren Jeng , Chang-Pin Chou, Nanoscratch characterization of GaN epilayers on c-and a-axis.