實驗室簡介

實驗室成員

研究方向

研究成果

分子束磊晶系統

光學量測系統

光學量測系統

English

 

Crygenic Cathodoluminescence system

Prof. Wu-Ching Chou’s Low temperature (10K-300K) cathodo-luminescence (CL) system include a JEOL 7001 scanning electron microscope (SEM) and two spectrometers, which can analyze the CL spectrum from infrared (3 μm) to ultra-violet (200 nm). This CL intrument can be used to study the photonic properties of nano-structured semiconductors. Reference: Nanotechnology 21, 465701 (2010)

Electron beam: Field emission

Acceleration voltage: 0.5 to 30 kV

Magnification: 25-200,000

Sample size: 15x15x10(W/D/H, nm)

Resolution: 1.5nm (15kV)、3.0nm ( 1 kV)

 

 

 

photo-luminescence (PL) spectru:

Prof. Wu-Ching Chou’s laboratory of optical spectroscopy has several spectrometers, which were used to analyze the spectrum from infrared (2 μm) to ultra-violet (300 nm). He-Cd laser and Ar ion laser were used to excite the photo-luminescence (PL) spectrum. Raman scattering, reflectance, and transmission experiments were also used to investigate the optical properties of photonic semiconductors. Furthermore, pulsed laser diodes were  used to excite the time resolved PL spectrum for the study of electron and hole recombination dynamics.

 

 

 

NT - MDT P47 Scanning Probe Microscopy

NT - MDT P47 Scanning Probe Microscopy

Using AFM or STM to measure the surface morphology, Adhesion force, capacitance and etc.

NT - MDT P47 Scanning Probe Microscopy

(Left Picture)

Z - resolution

~1 nm

 

 

 

 

Other facilities

PL Measurement system, Time-Resolved-PL System, Micro-Raman System, High-Pressure Raman System